Oxford instruments MAXXI 6

Description

Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U.
With superior resolution and high efficiency SDD, the MAXXI6 is the ideal instrument for measuring the thinnest coatings down to nanometer scale and element composition at trace level.
Superior resolution and high efficiency SDD
8 collimators
Giant slotted chamber
USB connection to the computer
Made in Germany
Key features

Superior resolution Silicon drift detector (SDD) offers optimal efficiency at all energy levels with energy resolution up to 140eV
Industry leading design of the collimator changer offers 8 exchangeable collimators to cover the complete application needs
Giant slotted chamber with generous interior volume, ideal for a big variety of standard and oversized samples
The ?USB easy choice? allows operation using a standard computer through USB connection with no additional hardware or firmware
Intuitive WindowsTM 7 based MaxxControl software offers choice of empirical calibration for highest accuracy and FP model for ease of use
Unlimited selection of elements and layer structure for thickness and composition analysis
Made in Germany to the highest standards of engineering and long term reliability
Approved by PTB (Physikalisch Technische Bundesantalt) ensures highest level of radiation safety