Description
The XUV 773 is designed for thin layer measurement and analysis in general. Therefore it is dedicated for research, quality control and optimization of production processes. Typical applications are:
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
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