Description
Specifications | |
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Aperture | 4-X Automatically Exchangeable Fixed |
Aperture Diameter | Up to 0.3 mm |
Adjustable Measuring Distance | 0 to 27.5 mm |
Maximum Operating Voltage | 50 kV |
Maximum Operating Power | 50 W |
Intended Application | Coating Thickness Material Analysis |
Characteristics |
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Typical Fields of Application | |
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Additional Information | |
Despite their compact size, these instruments feature a high-volume measurement chamber, so that even big objects can be measured. An opening in the housing C-slot) allows for measurements on large, flat samples such as printed circuit boards that might otherwise not fit into the measurement space.
The sample is placed directly on the flat support, or for even higher orientation precision, on the optionally available manual XY-stage. The XUL® and XULM® instruments are both equipped with proportional counter tube detectors; however they differ in their X-ray tubes, filters and apertures. The robust and cost-effective XUL® is furnished with one aperture and one fixed filter. The standard built-in X-ray tube has a larger primary beam spot; therefore, the smallest useful aperture is 0.3 mm. Because of beam divergence, only measurement spots of about 0.7 mm – 1 mm can be resolved. The XULM® is used for smaller structures. It is furnished with a micro-focus tube that also allows for small measurement spots down to about 100 μm, while the proportional counter tube detector still allows for relatively high count rates. Very good repeatability precision can be achieved even at short measuring times. Additionally, the XULM® instruments feature automatically interchangeable apertures and multi-filters to flexibly create optimum excitation conditions for various measuring applications. Examples from practical applications |
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