FISCHERSCOPE X-RAY XDL

Description

Description:
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL? series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating