Description
Description:
The XDAL instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
Typical areas of application are:
Analysis of very thin coatings, e.g. gold and palladium coatings of = 0.1 ?m
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g. in quality control
Determination of the lead content in solder
Features
- Universal X-ray fluorescence spectrometer for automated measurements on layers <0.0 5μm and for material analysis in the ppm range according to DIN ISO 3497 and ASTM B 568
- 3 different detector options (Si-PIN diode; SDD 20 mm²; SDD 50 mm²)
- 3x changeable primary filters
- 4x changeable collimators
- Smallest measuring spot approx. 0.15 mm
- Sample heights up to 14 cm
- Programmable XY stage with positioning accuracy of 10 µm
- Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
- Slotted housing for measuring on large printed circuit boards
- Certified fully protective device
Applications
- Material analysis of coatings and alloys (also thin coatings and low concentrations)
- Electronics industry, ENIG/ENEPIG
- Connectors and contacts
- Gold, jewelry and watchmaking industry
- Measurement of thin (a few nanometers) gold and palladium coatings in PCB manufacturing
- Analysis of trace elements
- Determination of lead (Pb) for high-reliability applications (tin-whisker avoidance)
- Analysis of hard material coatings
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