Description
Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement
Features
Universal premium instrument with comprehensive measurement capabilities
Aperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeable
With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning ?
Typical fields of application
Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
Trace analysis for consumer protection, e.g. lead content in toys
Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
Research in universities and in the industries
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