Description
It is particularly suited for the analysis of precious metals and their alloys in composition and coating thickness. Up to 24 elements in the range of Chlorine (17) to Uranium (92) can be determined simultaneously.
Typical fields of application are the analysis of:
• Jewelry, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
• Multi layer coatings
Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.
The modern silicon drift detector achieves high accuracy and good detection sensitivity.
The fundamental parameter method by Fischer allows for the analysis of solid and
liquid specimens as well as coating systems without calibration.
XRF Instrument Features
- Universal X-ray fluorescence (XRF) spectrometers for metal and precious-metal analysis, coating thickness measurement and RoHS screening according to DIN ISO 3497 and ASTM B 568
- Premium semiconductor detectors (PIN and SDD) ensure excellent detection accuracy and high resolution
- XAN 250 and 252: for measuring light elements like aluminum, silicon or sulfur
- Collimator: fixed or 4x changeable, smallest measuring spot approx. 0.3mm
- Primary filter: fixed or 6x changeable
- Fixed sample support or a manual XY stage
- Video camera for easy location of the best measurement site
- Up to 17 cm sample height
- Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
XRF Instrument Applications
- Non-destructive analysis of dental alloys, silver test
- Multilayer coatings
- Analysis of functional coatings at least 10 nm thick in the electronics and semiconductor industry
- Trace analysis in consumer protection, e.g. testing for the presence of lead in toys
- Metal-alloy determinations according to the highest accuracy requirements in the jewelry industry and in refineries
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