Description
Product Description
FISCHERSCOPE X-RAY XDV-SDD
is an optimally performing X-ray fluorescence (XRF) measuring system having a programmable XY-stage and Z-axis for trace analysis and automatic measurements of extremely thin coatings.
Features:
- Outstanding designs with universal application attributes
- Flexibility of highest excitation for the spectral composition and measurement spot size
- Provided with silicon drift detector which can enable detection of extremely high intensities > 100 kcps without a energy resolution deficit
- Big and conveniently reachable measurement chamber
- Outstanding repeatability and extremely low detection limits
Applications:
- Electronics and semiconductor industries
- Detection of harmful substances, as per RoHS, packaging standards and toy standards
- Analysis of precious metal like Gold with optimum level of accuracy
- Measurement of thickness and composition of NiP-layers
- Photovoltaic industry
Specification
| Usage/Application | Analysis of Gold,Silver and other precious metals |
| Model Number/Name | XDV-SDD |
| Analysis Elements | Silver, Copper, GUsed, Platinum |
| Operation Mode | Automatic |
| Automation Grade | Automatic |
| Power Type | Electric |
| Dimension | 403 x 588 x 365 mm |
| Brand | Fischer |
| Power Supply | AC 115 V or AC 230 V 50 / 60 Hz |
| Protection Class | IP40 |
| Repeatability | Greater than 1 % for gold,measurement time 60 sec |
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