Description
Oxford CMI730
CMI-730Measure non-conductive coatings over nonmagnetic substrates,
metallic coatings on ferrous substrates and conductive coatings on
nonconductive substrates
Eddy Current Probes: Zn, Cd, Cr, Cu on Steel, Organic, Paint & Powder
Coats on Al, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic substrates
Magnetic Induction Probes: Zn Ni, Cd, Cr, Cu, Organic, Paint & Powder,
etc. Coatings on Steel
Accurately quantify coating thickness after deposition
The CMI-730 package enables control of plating / coating processes
using advanced magnetic induction and eddy-current technology. The
CMI730 provides non-destructive coating / plating thickness
measurement for non-magnetic coatings over magnetic substrates,
non-conductive coatings over non-magnetic substrates and metallic
coatings on ferrous substrates.Features:
High contrast color LCD display
Memory to store up to 5000 measurements, parameters and calibrations
RS232 PC connectivity
Parallel printer port
Multi-level user password security system
Statistical data analysis with histogram, X-bar, R-chart, trend charts
which can be viewed on the display or printed direct from the
instrument.
metallic coatings on ferrous substrates and conductive coatings on
nonconductive substrates
Eddy Current Probes: Zn, Cd, Cr, Cu on Steel, Organic, Paint & Powder
Coats on Al, Anodize on Al etc.
Measure nonmagnetic coatings over magnetic substrates
Magnetic Induction Probes: Zn Ni, Cd, Cr, Cu, Organic, Paint & Powder,
etc. Coatings on Steel
Accurately quantify coating thickness after deposition
The CMI-730 package enables control of plating / coating processes
using advanced magnetic induction and eddy-current technology. The
CMI730 provides non-destructive coating / plating thickness
measurement for non-magnetic coatings over magnetic substrates,
non-conductive coatings over non-magnetic substrates and metallic
coatings on ferrous substrates.Features:
High contrast color LCD display
Memory to store up to 5000 measurements, parameters and calibrations
RS232 PC connectivity
Parallel printer port
Multi-level user password security system
Statistical data analysis with histogram, X-bar, R-chart, trend charts
which can be viewed on the display or printed direct from the
instrument.
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